JPH0467342U - - Google Patents

Info

Publication number
JPH0467342U
JPH0467342U JP11001590U JP11001590U JPH0467342U JP H0467342 U JPH0467342 U JP H0467342U JP 11001590 U JP11001590 U JP 11001590U JP 11001590 U JP11001590 U JP 11001590U JP H0467342 U JPH0467342 U JP H0467342U
Authority
JP
Japan
Prior art keywords
integrated circuit
semiconductor integrated
evaluation device
temperature measurement
circuit evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11001590U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11001590U priority Critical patent/JPH0467342U/ja
Publication of JPH0467342U publication Critical patent/JPH0467342U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11001590U 1990-10-19 1990-10-19 Pending JPH0467342U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11001590U JPH0467342U (en]) 1990-10-19 1990-10-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11001590U JPH0467342U (en]) 1990-10-19 1990-10-19

Publications (1)

Publication Number Publication Date
JPH0467342U true JPH0467342U (en]) 1992-06-15

Family

ID=31857293

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11001590U Pending JPH0467342U (en]) 1990-10-19 1990-10-19

Country Status (1)

Country Link
JP (1) JPH0467342U (en])

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